3 results
Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1050-1051
- Print publication:
- August 2019
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Integrated Array Tomography for High Throughput Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1038-1039
- Print publication:
- August 2019
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Large-scale EM & Correlative Microscopy (Nanotomy & CLEM)
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 198-199
- Print publication:
- July 2016
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